Power Quality Certification
We can certify your equipment for power quality immunity, either at your site anywhere in the world, or in our lab.
SEMI F47
SEMI E6
SEMI S23
IEC 61000-4-11 and 61000-4-34
IEEE 1100 IEC 61000-4-30 Samsung Power Vaccine
IEEE 1100 IEC 61000-4-30 Samsung Power Vaccine
We are the primary certification laboratory for IEC 61000-4-30 Ed3 instruments.
Please Contact Us or Request a Quote to discuss your needs.
Please Contact Us or Request a Quote to discuss your needs.
Our staff is fully qualified to test semiconductor fabrication equipment for voltage sag immunity
according to SEMI F47, SEMI E6, SEMI S23, IEC 61000-4-11 and 61000-4-34,
and IEEE 1100.
As part of our test procedures, we offer recommendations on how to improve immunity too.
Power Quality Testing Services Offered
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Reasonable hourly, daily, and project rates, depending on your needs.Most of our test equipment is transportable, and can be brought to your site, for projects up to 480V, 3-phase, at up to 200 amps (It is sometimes quicker and less expensive to test small equipment in our California lab). Some common applications:
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Download Access Registration
Testing Downloads
Testing Notes, Manuals, and Technical Information
File | Description | Format / Size |
Preparing for PSL Testing.pdf | Preparing for PSL Testing |
853 KB |
Sample - Power Standards Lab SEMI F47 Report.pdf | Sample SEMI F47 Report from Power Standards Lab |
1,252 KB |
Sample- Power Standards Lab SEMI E6-0400 Report.pdf | Sample SEMI E6-0400 Report from Power Standards Lab |
1,252 KB |
Sample_SEMI_F47_report.pdf | Sample SEMI F47 voltage sag immunity report. A typical test report for a typical piece of semiconductor fabrication equipment. |
221 KB |
sola_sdn-4-24-100_f47_certificate.pdf | Sample SEMI F47 voltage sag immunity Certificate. A typical Voltage Sag Immunity certificate for a component. |
20 KB |
Brochure - PSL 61000-4-30.pdf | IEC 61000-4-30 - Power Quality Measurement Methods |
124 KB |